On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples

• Дата: 2017
• Автори: Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2017
• Назва видання: Functional Materials
• Теми: Devices and instruments
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/136677
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples / S.V. Malykhin, I.E. Garkusha, V.A. Makhlay, S.V. Surovitsky, M.V. Reshetnyak, S.S. Borisova // Functional Materials. — 2017. — Т. 24, № 1. — С. 179-183. — Бібліогр.: 15 назв. — англ.

The technique of X-ray diffraction investigation of coherence length and micro-strain level using approximation of diffraction line profiles by Gaussian and Cauchy functions as well as by harmonic analysis has been worked out for tungsten samples with quite perfect structure. The importance of right...