Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy
The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of...
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| Дата: | 2008 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2008
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| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/137225 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-137225 |
|---|---|
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dspace |
| spelling |
irk-123456789-1372252018-06-18T03:04:37Z Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. Characterization and properties The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of a homogeneous nanostructure on the initial substrate microrelief. For the first time it has been shown that the spectrum of electron states changes considerably during the growth of a nanostructured silicon film. 2008 Article Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/137225 en Functional Materials НТК «Інститут монокристалів» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Characterization and properties Characterization and properties |
| spellingShingle |
Characterization and properties Characterization and properties Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy Functional Materials |
| description |
The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of a homogeneous nanostructure on the initial substrate microrelief. For the first time it has been shown that the spectrum of electron states changes considerably during the growth of a nanostructured silicon film. |
| format |
Article |
| author |
Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. |
| author_facet |
Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. |
| author_sort |
Kulyk, S.P. |
| title |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_short |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_full |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_fullStr |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_full_unstemmed |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_sort |
study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| publisher |
НТК «Інститут монокристалів» НАН України |
| publishDate |
2008 |
| topic_facet |
Characterization and properties |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/137225 |
| citation_txt |
Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. |
| series |
Functional Materials |
| work_keys_str_mv |
AT kulyksp studyofnanostructuredlayersofsinglecrystalsiliconbyscanningtunnelspectroscopy AT melnichenkomm studyofnanostructuredlayersofsinglecrystalsiliconbyscanningtunnelspectroscopy AT svezhentsovakv studyofnanostructuredlayersofsinglecrystalsiliconbyscanningtunnelspectroscopy AT shmyryovaom studyofnanostructuredlayersofsinglecrystalsiliconbyscanningtunnelspectroscopy |
| first_indexed |
2023-10-18T21:15:49Z |
| last_indexed |
2023-10-18T21:15:49Z |
| _version_ |
1796152348836364288 |