Initial stages of diffusion and phase formation in Sc/Si layered systems

Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. Growth of ScSi silicide governed by diffusion kinetics was observed at all tempe...

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Бібліографічні деталі
Дата:2008
Автори: Voronov, D.L., Zubarev, E.N., Kondratenko, V.V., Pershun, Yu.P., Sevryukova, V.A., Bugayev, Ye.A.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2008
Назва видання:Functional Materials
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/137250
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Initial stages of diffusion and phase formation in Sc/Si layered systems / D.L. Voronov, E.N. Zubarev, V.V. Kondratenko, Yu.P. Pershun, V.A. Sevryukova, Ye.A. Bugayev // Functional Materials. — 2008. — Т. 15, № 1. — С. 30-37. — Бібліогр.: 23 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-137250
record_format dspace
spelling irk-123456789-1372502018-06-18T03:06:48Z Initial stages of diffusion and phase formation in Sc/Si layered systems Voronov, D.L. Zubarev, E.N. Kondratenko, V.V. Pershun, Yu.P. Sevryukova, V.A. Bugayev, Ye.A. Characterization and properties Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. Growth of ScSi silicide governed by diffusion kinetics was observed at all temperatures. Two growth stages of nonparabolic and parabolic behavior were revealed. Initial nonparabolic stage is characterized by higher diffusion coefficient, which decreases during annealing in 20 times due to silicide structural relaxation. After annihilation of excess free volume a transition to parabolic growth takes place. Parameters of interdiffusion (activation energy E ≈1 eV and pre-exponential factor D₀ = 4.10⁻¹² m²s⁻¹) were determined for parabolic growth stage. 2008 Article Initial stages of diffusion and phase formation in Sc/Si layered systems / D.L. Voronov, E.N. Zubarev, V.V. Kondratenko, Yu.P. Pershun, V.A. Sevryukova, Ye.A. Bugayev // Functional Materials. — 2008. — Т. 15, № 1. — С. 30-37. — Бібліогр.: 23 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/137250 en Functional Materials НТК «Інститут монокристалів» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Characterization and properties
Characterization and properties
spellingShingle Characterization and properties
Characterization and properties
Voronov, D.L.
Zubarev, E.N.
Kondratenko, V.V.
Pershun, Yu.P.
Sevryukova, V.A.
Bugayev, Ye.A.
Initial stages of diffusion and phase formation in Sc/Si layered systems
Functional Materials
description Kinetics of phase formation Sc/Si multilayers and Si/Sc/Si three-layers within the temperature range of 130-400°C has been studied by cross-sectional transmission electron microscopy and small-angle X-ray reflectometry. Growth of ScSi silicide governed by diffusion kinetics was observed at all temperatures. Two growth stages of nonparabolic and parabolic behavior were revealed. Initial nonparabolic stage is characterized by higher diffusion coefficient, which decreases during annealing in 20 times due to silicide structural relaxation. After annihilation of excess free volume a transition to parabolic growth takes place. Parameters of interdiffusion (activation energy E ≈1 eV and pre-exponential factor D₀ = 4.10⁻¹² m²s⁻¹) were determined for parabolic growth stage.
format Article
author Voronov, D.L.
Zubarev, E.N.
Kondratenko, V.V.
Pershun, Yu.P.
Sevryukova, V.A.
Bugayev, Ye.A.
author_facet Voronov, D.L.
Zubarev, E.N.
Kondratenko, V.V.
Pershun, Yu.P.
Sevryukova, V.A.
Bugayev, Ye.A.
author_sort Voronov, D.L.
title Initial stages of diffusion and phase formation in Sc/Si layered systems
title_short Initial stages of diffusion and phase formation in Sc/Si layered systems
title_full Initial stages of diffusion and phase formation in Sc/Si layered systems
title_fullStr Initial stages of diffusion and phase formation in Sc/Si layered systems
title_full_unstemmed Initial stages of diffusion and phase formation in Sc/Si layered systems
title_sort initial stages of diffusion and phase formation in sc/si layered systems
publisher НТК «Інститут монокристалів» НАН України
publishDate 2008
topic_facet Characterization and properties
url http://dspace.nbuv.gov.ua/handle/123456789/137250
citation_txt Initial stages of diffusion and phase formation in Sc/Si layered systems / D.L. Voronov, E.N. Zubarev, V.V. Kondratenko, Yu.P. Pershun, V.A. Sevryukova, Ye.A. Bugayev // Functional Materials. — 2008. — Т. 15, № 1. — С. 30-37. — Бібліогр.: 23 назв. — англ.
series Functional Materials
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first_indexed 2023-10-18T21:15:52Z
last_indexed 2023-10-18T21:15:52Z
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