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Depth Profiling of the Near-Surface Layer for Ge33as12se55 Thin Films

Depth Profiling of the Near-Surface Layer for Ge33as12se55 Thin Films

Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...

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Bibliographic Details
Main Authors: Shchurova, T.N., Savchenko, N.D., Popovic, K.O., Baran, N.Yu.
Format: Article
Language:English
Published: Інститут хімії поверхні ім. О.О. Чуйка НАН України 2010
Series:Хімія, фізика та технологія поверхні
Subjects:
Неорганічні та вуглецеві наноматеріали і наносистеми
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/29005
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http://dspace.nbuv.gov.ua/handle/123456789/29005

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