Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films

Near-stochiometric and carbon-rich a-Si₁₋xCx:H thin films were deposited using the magnetron sputtering of Si target in Ar/CH₄ gas mixture. As-deposited nearstochimetric (x = 0.5) sample showed weak blue photoluminescence (PL), while PL of as-deposited carbon-rich (x = 0.7) sample was 20 times stron...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2015
Hauptverfasser: Vasin, A.V., Ishikawa, Y., Rusavsky, A.V., Nazarov, A.N., Konchitz, A.A., Lysenko, V.S.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/120720
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Zitieren:Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films / A.V. Vasin, Y. Ishikawa, A.V. Rusavsky, A.N. Nazarov, A.A. Konchitz, V.S. Lysenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 63-70. — Бібліогр.: 48 назв. — англ.

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author Vasin, A.V.
Ishikawa, Y.
Rusavsky, A.V.
Nazarov, A.N.
Konchitz, A.A.
Lysenko, V.S.
author_facet Vasin, A.V.
Ishikawa, Y.
Rusavsky, A.V.
Nazarov, A.N.
Konchitz, A.A.
Lysenko, V.S.
citation_txt Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films / A.V. Vasin, Y. Ishikawa, A.V. Rusavsky, A.N. Nazarov, A.A. Konchitz, V.S. Lysenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 63-70. — Бібліогр.: 48 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Near-stochiometric and carbon-rich a-Si₁₋xCx:H thin films were deposited using the magnetron sputtering of Si target in Ar/CH₄ gas mixture. As-deposited nearstochimetric (x = 0.5) sample showed weak blue photoluminescence (PL), while PL of as-deposited carbon-rich (x = 0.7) sample was 20 times stronger and white in color. The films were annealed in pure argon, wet argon, and dry oxygen at 450 °C for 30 min. The intensity of PL in a-Si₁₋xCx:H layers were enhanced by the factor from 2 to 12 after annealing in dependence on the annealing atmosphere. The strongest oxidation and strongest light emission were observed in carbon-rich series (x = 0.7) after annealing in oxidizing atmosphere. Structural properties of the films were characterized by infra-red absorption spectroscopy, ellipsometry and electron paramagnetic resonance. The effect of carbon enrichment of a-Si₁₋xCx:H films and annealing atmosphere on the evolution of photoluminescence and local interatomic bonding structure in annealed material were studied and analyzed. It has been found that main effects of thermal treatments is strong enhancement of photoluminescence accompanied by formation of Si:C–Hn and Si–OxCy bonding. The strongest oxidation effect as well as strongest hotoluminescence were observed in carbon-rich a-SiC:H films.
first_indexed 2025-11-29T00:07:37Z
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2025-11-29T00:07:37Z
publishDate 2015
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Vasin, A.V.
Ishikawa, Y.
Rusavsky, A.V.
Nazarov, A.N.
Konchitz, A.A.
Lysenko, V.S.
2017-06-12T17:52:42Z
2017-06-12T17:52:42Z
2015
Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films / A.V. Vasin, Y. Ishikawa, A.V. Rusavsky, A.N. Nazarov, A.A. Konchitz, V.S. Lysenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 63-70. — Бібліогр.: 48 назв. — англ.
1560-8034
DOI: 10.15407/spqeo18.01.063
PACS 61.72.uf, 76.30.-v, 77.84.Bw, 78.55.Qr
https://nasplib.isofts.kiev.ua/handle/123456789/120720
Near-stochiometric and carbon-rich a-Si₁₋xCx:H thin films were deposited using the magnetron sputtering of Si target in Ar/CH₄ gas mixture. As-deposited nearstochimetric (x = 0.5) sample showed weak blue photoluminescence (PL), while PL of as-deposited carbon-rich (x = 0.7) sample was 20 times stronger and white in color. The films were annealed in pure argon, wet argon, and dry oxygen at 450 °C for 30 min. The intensity of PL in a-Si₁₋xCx:H layers were enhanced by the factor from 2 to 12 after annealing in dependence on the annealing atmosphere. The strongest oxidation and strongest light emission were observed in carbon-rich series (x = 0.7) after annealing in oxidizing atmosphere. Structural properties of the films were characterized by infra-red absorption spectroscopy, ellipsometry and electron paramagnetic resonance. The effect of carbon enrichment of a-Si₁₋xCx:H films and annealing atmosphere on the evolution of photoluminescence and local interatomic bonding structure in annealed material were studied and analyzed. It has been found that main effects of thermal treatments is strong enhancement of photoluminescence accompanied by formation of Si:C–Hn and Si–OxCy bonding. The strongest oxidation effect as well as strongest hotoluminescence were observed in carbon-rich a-SiC:H films.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
Article
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spellingShingle Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
Vasin, A.V.
Ishikawa, Y.
Rusavsky, A.V.
Nazarov, A.N.
Konchitz, A.A.
Lysenko, V.S.
title Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
title_full Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
title_fullStr Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
title_full_unstemmed Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
title_short Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films
title_sort photoluminescent properties of oxidized stochiometric and carbon-rich amorphous si₁₋xcx:h films
url https://nasplib.isofts.kiev.ua/handle/123456789/120720
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AT konchitzaa photoluminescentpropertiesofoxidizedstochiometricandcarbonrichamorphoussi1xcxhfilms
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