Electrical properties of InSb p-n junctions prepared by diffusion methods

InSb p-n junctions were prepared by three diffusion methods, including isothermal, two-temperature and two-stage diffusion processes. The current-voltage characteristics were measured as a function of temperature and bias voltage. The highest values of the resistance-area product at zero bias have b...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2016
Автори: Sukach, A.V., Tetyorkin, V.V., Tkachuk, A.I.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121603
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Electrical properties of InSb p-n junctions prepared by diffusion methods / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 295-298. — Бібліогр.: 20 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
author_facet Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
citation_txt Electrical properties of InSb p-n junctions prepared by diffusion methods / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 295-298. — Бібліогр.: 20 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description InSb p-n junctions were prepared by three diffusion methods, including isothermal, two-temperature and two-stage diffusion processes. The current-voltage characteristics were measured as a function of temperature and bias voltage. The highest values of the resistance-area product at zero bias have been obtained for the junctions prepared using the two-stage diffusion process.
first_indexed 2025-11-25T21:07:28Z
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2025-11-25T21:07:28Z
publishDate 2016
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
2017-06-14T17:53:19Z
2017-06-14T17:53:19Z
2016
Electrical properties of InSb p-n junctions prepared by diffusion methods / A.V. Sukach, V.V. Tetyorkin, A.I. Tkachuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 295-298. — Бібліогр.: 20 назв. — англ.
1560-8034
DOI: 10.15407/spqeo19.03.295
PACS 73.40.Gk, 73.40.Kp
https://nasplib.isofts.kiev.ua/handle/123456789/121603
InSb p-n junctions were prepared by three diffusion methods, including isothermal, two-temperature and two-stage diffusion processes. The current-voltage characteristics were measured as a function of temperature and bias voltage. The highest values of the resistance-area product at zero bias have been obtained for the junctions prepared using the two-stage diffusion process.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Electrical properties of InSb p-n junctions prepared by diffusion methods
Article
published earlier
spellingShingle Electrical properties of InSb p-n junctions prepared by diffusion methods
Sukach, A.V.
Tetyorkin, V.V.
Tkachuk, A.I.
title Electrical properties of InSb p-n junctions prepared by diffusion methods
title_full Electrical properties of InSb p-n junctions prepared by diffusion methods
title_fullStr Electrical properties of InSb p-n junctions prepared by diffusion methods
title_full_unstemmed Electrical properties of InSb p-n junctions prepared by diffusion methods
title_short Electrical properties of InSb p-n junctions prepared by diffusion methods
title_sort electrical properties of insb p-n junctions prepared by diffusion methods
url https://nasplib.isofts.kiev.ua/handle/123456789/121603
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