Погрешности при измерении характеристик рентгеновских установок
Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installa...
Збережено в:
| Дата: | 2011 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | Ukrainian |
| Опубліковано: |
PE "Politekhperiodika", Book and Journal Publishers
2011
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| Теми: | |
| Онлайн доступ: | https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.3.44 |
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| Назва журналу: | Technology and design in electronic equipment |
Репозитарії
Technology and design in electronic equipment| Резюме: | Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installation with requirements to errors of standard X-ray radiation features with narrow spectrum on DSTU ISO 4037-1:2006. Criteria of choosing the additional filters thickness for measurement 1st HVL and 2nd HVL are defined. The errors resulting from calculation of mean photon energy of X-ray radiation and homogeneity coefficient are specified. |
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