Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2

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Бібліографічні деталі
Дата:2010
Автори: S. V. Bunak, A. A. Buyanin, V. V. Ilchenko, V. V. Marin, V. P. Melnik, I. M. Khacevich, O. V. Tretyak, A. G. Shkavro
Формат: Стаття
Мова:Англійська
Опубліковано: 2010
Назва видання:Semiconductor Physics, Quantum Electronics and Optoelectronics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000349118
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author S. V. Bunak
A. A. Buyanin
V. V. Ilchenko
V. V. Marin
V. P. Melnik
I. M. Khacevich
O. V. Tretyak
A. G. Shkavro
author_facet S. V. Bunak
A. A. Buyanin
V. V. Ilchenko
V. V. Marin
V. P. Melnik
I. M. Khacevich
O. V. Tretyak
A. G. Shkavro
author_sort S. V. Bunak
collection Open-Science
first_indexed 2025-07-22T15:14:48Z
format Article
id open-sciencenbuvgovua-100040
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
last_indexed 2025-07-22T15:14:48Z
publishDate 2010
record_format dspace
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spelling open-sciencenbuvgovua-1000402024-04-17T17:54:38Z Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2 S. V. Bunak A. A. Buyanin V. V. Ilchenko V. V. Marin V. P. Melnik I. M. Khacevich O. V. Tretyak A. G. Shkavro 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349118 Article
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
S. V. Bunak
A. A. Buyanin
V. V. Ilchenko
V. V. Marin
V. P. Melnik
I. M. Khacevich
O. V. Tretyak
A. G. Shkavro
Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title_full Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title_fullStr Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title_full_unstemmed Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title_short Electrical properties of semiconductor structures with Si nanoclusters in SiO2 grown by high temperature annealing technology of SiOX layer, X<2
title_sort electrical properties of semiconductor structures with si nanoclusters in sio2 grown by high temperature annealing technology of siox layer, x<2
url http://jnas.nbuv.gov.ua/article/UJRN-0000349118
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