Double- and triple-crystal X-ray diffractometry of microdefects in silicon
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| Дата: | 2010 |
|---|---|
| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2010
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| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000349374 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859602913304772608 |
|---|---|
| author | V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova |
| author_facet | V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova |
| author_sort | V. B. Molodkin |
| collection | Open-Science |
| first_indexed | 2025-07-22T15:15:14Z |
| format | Article |
| id | open-sciencenbuvgovua-100103 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T15:15:14Z |
| publishDate | 2010 |
| record_format | dspace |
| series | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spelling | open-sciencenbuvgovua-1001032024-04-17T17:55:25Z Double- and triple-crystal X-ray diffractometry of microdefects in silicon V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349374 Article |
| spellingShingle | Semiconductor Physics, Quantum Electronics and Optoelectronics V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title | Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_full | Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_fullStr | Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_full_unstemmed | Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_short | Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_sort | double- and triple-crystal x-ray diffractometry of microdefects in silicon |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000349374 |
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