Double- and triple-crystal X-ray diffractometry of microdefects in silicon

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

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Bibliographic Details
Date:2010
Main Authors: V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Format: Article
Language:English
Published: 2010
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000349374
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-100103
record_format dspace
spelling open-sciencenbuvgovua-1001032024-04-17T17:55:25Z Double- and triple-crystal X-ray diffractometry of microdefects in silicon V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349374 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
V. B. Molodkin
S. I. Olikhovskii
Ye. M. Kyslovskyy
E. G. Len
O. V. Reshetnyk
T. P. Vladimirova
V. V. Lizunov
S. V. Lizunova
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
format Article
author V. B. Molodkin
S. I. Olikhovskii
Ye. M. Kyslovskyy
E. G. Len
O. V. Reshetnyk
T. P. Vladimirova
V. V. Lizunov
S. V. Lizunova
author_facet V. B. Molodkin
S. I. Olikhovskii
Ye. M. Kyslovskyy
E. G. Len
O. V. Reshetnyk
T. P. Vladimirova
V. V. Lizunov
S. V. Lizunova
author_sort V. B. Molodkin
title Double- and triple-crystal X-ray diffractometry of microdefects in silicon
title_short Double- and triple-crystal X-ray diffractometry of microdefects in silicon
title_full Double- and triple-crystal X-ray diffractometry of microdefects in silicon
title_fullStr Double- and triple-crystal X-ray diffractometry of microdefects in silicon
title_full_unstemmed Double- and triple-crystal X-ray diffractometry of microdefects in silicon
title_sort double- and triple-crystal x-ray diffractometry of microdefects in silicon
publishDate 2010
url http://jnas.nbuv.gov.ua/article/UJRN-0000349374
work_keys_str_mv AT vbmolodkin doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT siolikhovskii doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT yemkyslovskyy doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT eglen doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT ovreshetnyk doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT tpvladimirova doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT vvlizunov doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
AT svlizunova doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon
first_indexed 2025-07-22T15:15:14Z
last_indexed 2025-07-22T15:15:14Z
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