Double- and triple-crystal X-ray diffractometry of microdefects in silicon
Збережено в:
| Дата: | 2010 |
|---|---|
| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2010
|
| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000349374 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-100103 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-1001032024-04-17T17:55:25Z Double- and triple-crystal X-ray diffractometry of microdefects in silicon V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova 1560-8034 2010 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349374 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| format |
Article |
| author |
V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova |
| author_facet |
V. B. Molodkin S. I. Olikhovskii Ye. M. Kyslovskyy E. G. Len O. V. Reshetnyk T. P. Vladimirova V. V. Lizunov S. V. Lizunova |
| author_sort |
V. B. Molodkin |
| title |
Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_short |
Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_full |
Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_fullStr |
Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_full_unstemmed |
Double- and triple-crystal X-ray diffractometry of microdefects in silicon |
| title_sort |
double- and triple-crystal x-ray diffractometry of microdefects in silicon |
| publishDate |
2010 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000349374 |
| work_keys_str_mv |
AT vbmolodkin doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT siolikhovskii doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT yemkyslovskyy doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT eglen doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT ovreshetnyk doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT tpvladimirova doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT vvlizunov doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon AT svlizunova doubleandtriplecrystalxraydiffractometryofmicrodefectsinsilicon |
| first_indexed |
2025-07-22T15:15:14Z |
| last_indexed |
2025-07-22T15:15:14Z |
| _version_ |
1850421953507098624 |