Cover Image

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

Saved in:

Bibliographic Details
Date:	2010
Main Authors:	V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Format:	Article
Language:	English
Published:	2010
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000349374
Tags:	Add Tag No Tags, Be the first to tag this record!
Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

Institution

Library portal of National Academy of Sciences of Ukraine | LibNAS

Similar Items

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
by: Molodkin, V.B., et al.
Published: (2016)

X-ray dynamical diffractometry of defect structure of garnet single crystals
by: V. M. Pylypiv, et al.
Published: (2011)

Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field
by: T. P. Vladimirova, et al.
Published: (2011)

Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
by: O. S. Skakunova, et al.
Published: (2015)

New Performance Capabilities of Integral Dynamical Diffractometry of Crystal Imperfections
by: V. V. Lizunov, et al.
Published: (2015)

Dynamical diffractometry of Structural defects in Nd3Ga5O12 garnet single crystal
by: T. P. Vladimirova, et al.
Published: (2011)

Dynamical Diffractometry of Defects and Strains in Gd3Ga5O12 Garnet Crystals After Implantation with F+ Ions
by: O. S. Skakunova, et al.
Published: (2013)

Investigation of Plasmon Gold Film Nanostructures by Means of both X-Ray Reflectometry and Diffractometry
by: A. I. Gudymenko, et al.
Published: (2015)

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry
by: I. M. Fodchuk, et al.
Published: (2010)

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry
by: Fodchuk, І.М., et al.
Published: (2010)

X-Ray Diffractometry of Lanthanum-Doped Iron—Yttrium Garnet Structures after Ion Implantation
by: I. M. Fodchuk, et al.
Published: (2013)

Anisotropy of elastic deformations in multilayer (In,Ga)As/GaAs structures with quantum wires: X-ray diffractometry study
by: Strelchuk, V.V., et al.
Published: (2005)

Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
by: S. I. Drapak, et al.
Published: (2022)

Characterization of nanostructured In6Se7 inclusions in layered α-In2Se3 crystals using analytical X-ray diffractometry methods
by: S. I. Drapak, et al.
Published: (2022)

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data
by: M. D. Borcha, et al.
Published: (2019)

New approaches and possibilities of a dynamical diffractometry of imperfections of multiparameter systems
by: V. V. Lizunov, et al.
Published: (2014)

Detection of microdefects on the surface of corroded steel pipe
by: P. O. Marushchak, et al.
Published: (2020)

Dynamical Theory of Grazing Diffuse Scattering of X-Rays by a Crystal with Subsurface Defects
by: Ju. Gaevskij, et al.
Published: (2014)

Techniques for x-ray focusing
by: V. E. Storizhko, et al.
Published: (2010)

X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals
by: Grigas, J., et al.
Published: (2008)

Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering
by: A. P. Shpak, et al.
Published: (2009)

Integrated diffractometry: achieved progress and new performance capabilities
by: V. V. Lizunov, et al.
Published: (2019)

Integrated diffractometry: achieved progress and new performance capabilities
by: Lizunov, V.V., et al.
Published: (2019)

Unique informativity of the diffuse dynamical combined diffractometry of materials and products of nanotechnologies
by: A. P. Shpak, et al.
Published: (2008)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of Strains and Defects in Ion-Implanted Garnet Films
by: V. B. Molodkin, et al.
Published: (2015)

Anomalous conductivity in ZnSe single crystals by X-ray irradiation
by: Ya. Degoda, et al.
Published: (2012)

Anomalous conductivity in ZnSe single crystals by X-ray irradiation
by: Ya. Dehoda, et al.
Published: (2012)

Notes on coherent polarization X-ray radiation by relativistic electrons in a crystal
by: Morokhovskii, V.L.
Published: (2019)

X-ray investigation of dibenzotetraaza|14|annulene thin films crystal structure
by: V. G. Udovitskij
Published: (2003)

Investigation of the optical coatings on the DKDP single crystals by X-ray photoelectron spectroscopy
by: Yu. Loya, et al.
Published: (2004)

The Role of Inhomogeneous Deformation and Correlation of Subsurface Defects in Grazing X-Ray Diffraction
by: Ju. Gaevskij, et al.
Published: (2014)

X-ray study of dopant state in highly doped semiconductor single crystals
by: I. L. Shulpina, et al.
Published: (2011)

X-ray characterization of ZnSe single crystals doped with Mg
by: Fedorov, A.G., et al.
Published: (2001)

The Spectra of X-ray and photoluminescence of high-resistance crystals of ZnSe
by: M. Alizadeh, et al.
Published: (2018)

The Spectra of X-ray and photoluminescence of high-resistance crystals of ZnSe
by: M. Alizadeh, et al.
Published: (2018)

Relative sensitivity of X-Ray TV systems based on pulsed X-Ray units
by: N. G. Belyj, et al.
Published: (2013)

Research on mechanical stress relaxation in real crystals by X-ray diffraction moire method
by: V. P. Shafraniuk
Published: (2016)

Cross Topology and Lebesgue Triples
by: O. O. Karlova, et al.
Published: (2013)

The study of the influence of X-ray irradiation on dislocation characteristics in LiF crystals
by: Petchenko, О.M., et al.
Published: (2021)

Impurity concentration influence on the correlation of the x-ray lines intensity in metal-fullerene crystals
by: A. N. Drozdov, et al.
Published: (2009)