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Double- and triple-crystal X-ray diffractometry of microdefects in silicon

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Bibliographische Detailangaben
Datum:	2010
Hauptverfasser:	V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, E. G. Len, O. V. Reshetnyk, T. P. Vladimirova, V. V. Lizunov, S. V. Lizunova
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	2010
Schriftenreihe:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000349374
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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