Investigation of temperature fields in microelectronic devices of layered structure with through inclusions
Збережено в:
| Дата: | 2017 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2017
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| Назва видання: | Electronic modeling |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000800015 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-39347 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-393472024-02-29T11:45:35Z Investigation of temperature fields in microelectronic devices of layered structure with through inclusions V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus 0204-3572 2017 en Electronic modeling http://jnas.nbuv.gov.ua/article/UJRN-0000800015 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Electronic modeling |
| spellingShingle |
Electronic modeling V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| format |
Article |
| author |
V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus |
| author_facet |
V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus |
| author_sort |
V. I. Gavrysh |
| title |
Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_short |
Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_full |
Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_fullStr |
Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_full_unstemmed |
Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_sort |
investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| publishDate |
2017 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000800015 |
| work_keys_str_mv |
AT vigavrysh investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT rbtushnitskij investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT jakrajovskij investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT evlevus investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions |
| first_indexed |
2025-07-17T19:17:58Z |
| last_indexed |
2025-07-17T19:17:58Z |
| _version_ |
1850415268429299712 |