Investigation of temperature fields in microelectronic devices of layered structure with through inclusions
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| Datum: | 2017 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
2017
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| Schriftenreihe: | Electronic modeling |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000800015 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859509641385345024 |
|---|---|
| author | V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus |
| author_facet | V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus |
| author_sort | V. I. Gavrysh |
| collection | Open-Science |
| first_indexed | 2025-07-17T19:17:58Z |
| format | Article |
| id | open-sciencenbuvgovua-39347 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T19:17:58Z |
| publishDate | 2017 |
| record_format | dspace |
| series | Electronic modeling |
| spelling | open-sciencenbuvgovua-393472024-02-29T11:45:35Z Investigation of temperature fields in microelectronic devices of layered structure with through inclusions V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus 0204-3572 2017 en Electronic modeling http://jnas.nbuv.gov.ua/article/UJRN-0000800015 Article |
| spellingShingle | Electronic modeling V. I. Gavrysh R. B. Tushnitskij Ja. Krajovskij E. V. Levus Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title | Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_full | Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_fullStr | Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_full_unstemmed | Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_short | Investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| title_sort | investigation of temperature fields in microelectronic devices of layered structure with through inclusions |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000800015 |
| work_keys_str_mv | AT vigavrysh investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT rbtushnitskij investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT jakrajovskij investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions AT evlevus investigationoftemperaturefieldsinmicroelectronicdevicesoflayeredstructurewiththroughinclusions |