Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
Saved in:
| Date: | 2015 |
|---|---|
| Main Authors: | O. S. Skakunova, S. Y. Olikhovskyi, V. B. Molodkin, Ye. H. Len, Ye. M. Kyslovskyi, O. V. Reshetnyk, T. P. Vladimirova, Ye. V. Kochelab, V. V. Lizunov, S. V. Lizunova, V. L. Makivska, M. H. Tolmachov, L. M. Skapa, Ya. V. Vasylyk, K. V. Fuzik |
| Format: | Article |
| Language: | English |
| Published: |
2015
|
| Series: | Metallophysics and advanced technologies |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000551400 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: V. B. Molodkin, et al.
Published: (2010) -
Double- and triple-crystal X-ray diffractometry of microdefects in silicon
by: Molodkin, V.B., et al.
Published: (2010) -
Dynamical Diffractometry of Defects and Strains in Gd3Ga5O12 Garnet Crystals After Implantation with F+ Ions
by: O. S. Skakunova, et al.
Published: (2013) -
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
by: Molodkin, V.B., et al.
Published: (2016) -
X-ray dynamical diffractometry of defect structure of garnet single crystals
by: V. M. Pylypiv, et al.
Published: (2011)