Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

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Bibliographic Details
Date:	2013
Main Authors:	A. V. Sachenko, V. P. Kostylov, V. H. Lytovchenko, V. H. Popov, B. M. Romaniuk, V. V. Chernenko, V. M. Nasieka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Format:	Article
Language:	English
Published:	2013
Series:	Ukrainian Journal of Physics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000725395
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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