Особливостi формування рекомбiнацiйного струму в областi просторового заряду кремнiєвих сонячних елементiв

Dark I–V curves of silicon solar cells with various Shockley–Reed–Hall lifetimes have been studied. The lifetimes are determined from the short-circuit-current internal quantum yield. The recombination currents in the space charge region (SCR) are found to be formed within time intervals that are at...

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Bibliographische Detailangaben
Datum:2019
Hauptverfasser: Sachenko, A. V., Kostylyov, V. P., Vlasiuk, V. M., Korkishko, R. M., Sokolovs’kyi, I. O., Chernenko, V. V.
Format: Artikel
Sprache:English
Ukrainian
Veröffentlicht: Publishing house "Academperiodika" 2019
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Online Zugang:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019029
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Назва журналу:Ukrainian Journal of Physics

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Ukrainian Journal of Physics
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Zusammenfassung:Dark I–V curves of silicon solar cells with various Shockley–Reed–Hall lifetimes have been studied. The lifetimes are determined from the short-circuit-current internal quantum yield. The recombination currents in the space charge region (SCR) are found to be formed within time intervals that are at least an order of magnitude shorter than the charge-carrier bulk lifetime. This effect can be associated with a high defect concentration (and, therefore, a high deep-level concentration) in the SCR of examined Si structures. The parameters of deep centers that are responsible for the recombination in the SCR have been evaluated.