Determination of surface parameters of solids by methods of X-ray total external reflection by Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.

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Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution by Fodchuk, I., Balovsyak, S., Borcha, M., Garabazhiv, Ya., Tkach, V.

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Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution by I. Fodchuk, S. Balovsyak, M. Borcha, Ya. Garabazhiv, V. Tkach

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Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions by I. M. Fodchuk, I. I. Gutsuliak, R. A. Zaplitniy, S. V. Balovsyak, I. P. Yaremiy, Yu. Bonchyk, G. V. Savitskiy, I. M. Syvorotka, P. M. Lytvyn

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Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions by Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data by M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data by Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

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