Modeling of X-ray rocking curves for layers after two-stage ion-implantation von Liubchenko, O.I., Kladko, V.P., Gudymenko, O.Yo.

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Structure and electrical resistance of the passivating ZnSe layer on Ge von Maslov, V.P., Fedorenko, A.V., Kladko, V.P., Gudymenko, O.Yo., Bozhko, K.M., Zashchepkina, N.M.

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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry von Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.

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Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film von Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.

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Formation of silicon nanoclusters in buried ultra-thin oxide layers von Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.

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Influence of small miscuts on self-ordered growth of Ge nanoislands von Gudymenko, O.Yo., Kladko, V.P., Yefanov, O.M., Slobodian, M.V., Polischuk, Yu.S., Krasilnik, Z.F., Lobanov, D.V., Novikov, А.А.

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Influence of microwave radiation on relaxation processes in silicon carbide von Bacherikov, Yu.Yu., Goroneskul, V.Yu., Gudymenko, O.Yo., Kladko, V.P., Kolomys, O.F., Krishchenko, I.M., Okhrimenko, O.B., Strelchuk, V.V.

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient von Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data von Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics von Vashchenko, V.A., Yatsenko, I.V., Kovalenko, Yu.I., Kladko, V.P., Gudymenko, O.Yo., Lytvyn, P.M., Korchovyi, A.A., Mamykin, S.V., Kondratenko, O.S., Maslov, V.P., Dorozinska, H.V., Dorozinsky, G.V.

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New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects von Molodkin, V.B., Storizhko, V.Yu., Kladko, V.P., Lizunov, V.V., Nizkova, A.I., Gudymenko, O.Yo., Olikhovskii, S.I., Tolmachev, M.G., Dmitriev, S.V., Demchyk, I.I., Bogdanov, E.I., Hinko, B.I.

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