Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness by Liubchenko, O.I., Kladko, V.P.

Get full text

Modeling of X-ray rocking curves for layers after two-stage ion-implantation by Liubchenko, O.I., Kladko, V.P., Gudymenko, O.Yo.

Get full text

Structural and composition irregularities in GaAs:Si/GaAs films grown by liquid-phase epitaxy by Kladko, V.P., Datsenko, L.I., Maksimenko, Z.V., Lytvyn, O.S., Prokopenko, I.V., Zytkiewicz, Z.

Get full text

X-ray diffraction investigation of GaN layers on Si(111) and Al₂O₃ (0001) substrates by Safriuk, N.V., Stanchu, G.V., Kuchuk, A.V., Kladko, V.P., Belyaev, A.E., Machulin, V.F.

Get full text

Anisotropy of elastic deformations in multilayer (In,Ga)As/GaAs structures with quantum wires: X-ray diffractometry study by Strelchuk, V.V., Kladko, V.P., Yefanov, O.M., Kolomys, O.F., Gudymenko, O.I., Valakh, M.Ya.

Get full text

Structure and electrical resistance of the passivating ZnSe layer on Ge by Maslov, V.P., Fedorenko, A.V., Kladko, V.P., Gudymenko, O.Yo., Bozhko, K.M., Zashchepkina, N.M.

Get full text

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures by Kladko, V.P., Kuchuk, A.V., Safryuk, N.V., Machulin, V.F., Belyaev, A.E., Konakova, R.V., Yavich, B.S.

Get full text

Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry by Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.

Get full text

Modification of properties of the glass-Si₃N₄-Si-SiO₂ structure at laser treatment by Konakova, R.V., Kladko, V.P., Lytvyn, O.S., Okhrimenko, O.B., Konoplev, B.G., Svetlichnyi, A.M., Lissotschenko, V.N.

Get full text

The effect of ion implantation on structural damage in compositionally graded AlGaN layers by Liubchenko, O.I., Kladko, V.P., Stanchu, H.V., Sabov, T.M., Melnik, V.P., Kryvyi, S.B., Belyaev, A.Ye.

Get full text

Influence of small miscuts on self-ordered growth of Ge nanoislands by Gudymenko, O.Yo., Kladko, V.P., Yefanov, O.M., Slobodian, M.V., Polischuk, Yu.S., Krasilnik, Z.F., Lobanov, D.V., Novikov, А.А.

Get full text

Heat-resistant barrier and ohmic contacts based on TiBx and ZrBx interstitial phases to microwave diode structures by Belyaev, A.E., Boltovets, N.S., Ivanov, V.N., Kladko, V.P., Konakova, R.V., Kudryk, Ya.Ya., Milenin, V.V., Sheremet, V.N.

Get full text

Investigation of superlattice structure parameters using quasi-forbidden reflections by Kladko, V.P., Datsenko, L.I., Korchovyi, A.A., Machulin, V.F., Lytvyn, P.M., Shalimov, A.V., Kuchuk, A.V., Kogutyuk, P.P.

Get full text

Influence of microwave radiation on relaxation processes in silicon carbide by Bacherikov, Yu.Yu., Goroneskul, V.Yu., Gudymenko, O.Yo., Kladko, V.P., Kolomys, O.F., Krishchenko, I.M., Okhrimenko, O.B., Strelchuk, V.V.

Get full text

Bio-SiC ceramics coated with hydroxyapatite using gas-detonation deposition: An alternative to titanium-based medical implants by Klyui, M.I., Temchenko, V.P., Gryshkov, O.P., Dubok, V.A., Kladko, V.P., Kuchuk, A.V., Dzhagan, V.M., Yukhymchuk, V.O., Kiselov, V.S.

Get full text

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient by Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.

Get full text

Deformation state of short-period AlGaN/GaN superlattices at different well-barrier thickness ratios by Kladko, V.P., Safriuk, N.V., Stanchu, H.V., Kuchuk, A.V., Melnyk, V.P., Oberemok, A.S., Kriviy, S.B., Maksymenko, Z.V., Belyaev, A.E., Yavich, B.S.

Get full text

Peculiarities of specular infrared reflection spectra of ZnO-based ceramics by Melnichuk, O.V., Korsunska, N.O., Markevich, I.V., Boyko, V.V., Polishchuk, Yu.O., Tsybrii, Z.F., Melnichuk, L.Yu., Venger, Ye.F., Kladko, V.P., Khomenkova, L.Yu.

Get full text

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data by Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

Get full text

The features of temperature dependence of contact resistivity of Au-Ti-Pd₂Si-p⁺ ₋Si ohmic contacts by Belyaev, A.E., Boltovets, N.S., Kapitanchuk, L.M., Konakova, R.V., Kladko, V.P., Kudryk, Ya.Ya., Kuchuk, A.V., Lytvyn, O.S., Milenin, V.V., Korostinskaya, T.V., Ataubaeva, A.B., Nevolin, P.V.

Get full text