Харвестер відкритої науки НАН України

Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices

von Maslov, V.P.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2008)

Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts

von Maslov, V.P., Kachur, N.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

Influence of elastic deformation on the residual ellipticity of polished optical materials

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Promising method for determining the concentration of nano-sized diamond powders in water suspensions

von Dorozinska, H.V., Dorozinsky, G.V., Maslov, V.P.
Veröffentlicht in Functional Materials (2018)

Strength of optical glass under conditions of axial compression

von Okhrimenko, G.M., Rodichev, Yu.M., Maslov, V.P.
Veröffentlicht in Проблемы прочности (1985)

Ellipsometric control of quality of polished MgF₂ optical ceramics

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

von Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy

von Berezhinsky, L.I., Yukhymchuk, V.A., Maslov, V.P., Tetyorkin, V.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)