Харвестер відкритої науки НАН України

Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices

за авторством Maslov, V.P.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2008)

Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts

за авторством Maslov, V.P., Kachur, N.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

Influence of elastic deformation on the residual ellipticity of polished optical materials

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Promising method for determining the concentration of nano-sized diamond powders in water suspensions

за авторством Dorozinska, H.V., Dorozinsky, G.V., Maslov, V.P.
Опубліковано в: Functional Materials (2018)

Strength of optical glass under conditions of axial compression

за авторством Okhrimenko, G.M., Rodichev, Yu.M., Maslov, V.P.
Опубліковано в: Проблемы прочности (1985)

Ellipsometric control of quality of polished MgF₂ optical ceramics

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

за авторством Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy

за авторством Berezhinsky, L.I., Yukhymchuk, V.A., Maslov, V.P., Tetyorkin, V.V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2005)