Харвестер відкритої науки НАН України

Применение статистических моделей в инженерии качества процессов производства программных систем...

von Matveeva, L.Е., Gorislavets, T.N.
Veröffentlicht 2015

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation

von Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.
Veröffentlicht in Вопросы атомной науки и техники (1999)

Investigation of the undersurface damaged layers in silicon wafers

von Holiney, R.Yu., Matveeva, L.A., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it

von Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)

Effects of interband phototunneling and filling the bands in electroreflectance spectra of germanium

von Gentsar, P.A., Matveeva, L.A., Kudryavtsev, A.A., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Радиационная технология улучшения омических контактов к элементам электронной техники

von Konakova, R. V., Kolyadina, Е. Yu., Matveeva, L. А., Nelyuba, P. L., Shynkarenko, V. V.
Veröffentlicht 2010

Получение, свойства и применение тонких нанонеоднородных пленок Ge на GaAs-подложках

von Venger, E. F., Lytvyn, P. M., Matveeva, L. A., Mitin, V. F., Kholevchuk, V. V.
Veröffentlicht 2014

Quantum-sized effects in oxidized silicon structures with surface II-VI nanocrystals

von Karachevtseva, L., Kuchmii, S., Kolyadina, O., Lytvynenko, O., Matveeva, L., Sapelnikova, O., Smirnov, O., Stroyuk, O.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)

The features of structural-impurity ordering of interfaces in Ta₂O₅-p-Si heterostructures (exposed to microwave pretreatment and aging) induced by further microwave treatment

von Kolyadina, E.Yu., Konakova, R.V., Matveeva, L.A., Mitin, V.F., Shynkarenko, V.V., Atanassova, E.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2008)

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments

von Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1998)

Potentiality of the composite fulleren based carbon films as the stripper foils for tandem accelerators

von Vasin, A.V., Matveeva, L.A., Kozeratskaya, G.N., Rusavsky, A.V., Totsky, Yu.I., Vishnevsky, I.N.
Veröffentlicht in Вопросы атомной науки и техники (2001)

Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system

von Konakova, R.V., Milenin, V.V., Voitsikhovskyi, D.I., Kamalov, A.B., Kolyadina, E.Yu., Lytvyn, P.M., Lytvyn, O.S., Matveeva, L.A., Prokopenko, I.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)

Influence of neutron irradiation on elctrooptical and structural properties of silicon

von Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)