Search Results - Matveeva, L.
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Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it by Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2015)Get full text
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Quantum-sized effects in oxidized silicon structures with surface II-VI nanocrystals by Karachevtseva, L., Kuchmii, S., Kolyadina, O., Lytvynenko, O., Matveeva, L., Sapelnikova, O., Smirnov, O., Stroyuk, O.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2014)Get full text
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The features of structural-impurity ordering of interfaces in Ta₂O₅-p-Si heterostructures (exposed to microwave pretreatment and aging) induced by further microwave treatment by Kolyadina, E.Yu., Konakova, R.V., Matveeva, L.A., Mitin, V.F., Shynkarenko, V.V., Atanassova, E.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2008)Get full text
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Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments by Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1998)Get full text
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Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system by Konakova, R.V., Milenin, V.V., Voitsikhovskyi, D.I., Kamalov, A.B., Kolyadina, E.Yu., Lytvyn, P.M., Lytvyn, O.S., Matveeva, L.A., Prokopenko, I.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)Get full text
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Influence of neutron irradiation on elctrooptical and structural properties of silicon by Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)Get full text
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Related Subjects
Ge films
UDC 681.3.06
electronic and optical properties
fullerene films
growth rate
intrinsic mechanical stresses
metallization
microwave annealing
surface morphology
УДК 681.3.06
внутренние механические напряжения
металлизация
микроволновый отжиг
морфология поверхности
пленки германия
скорость роста
фуллереновые пленки
электронные и оптические свойства