Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells by Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.

Get full text

Double- and triple-crystal X-ray diffractometry of microdefects in silicon by Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.

Get full text

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals by Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.

Get full text

New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects by Molodkin, V.B., Storizhko, V.Yu., Kladko, V.P., Lizunov, V.V., Nizkova, A.I., Gudymenko, O.Yo., Olikhovskii, S.I., Tolmachev, M.G., Dmitriev, S.V., Demchyk, I.I., Bogdanov, E.I., Hinko, B.I.

Get full text

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... by Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.

Get full text