SIMS study of deuterium distribution and thermal stability in ZMR SOI structures by Boutry-Forveille, A., Ballutaud, D., Nazarov, A.N.

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An analytical accumulation mode SOI pMOSFET model for high-temperature analog applications by Houk, Yu., Iniguez, B., Flandre, D., Nazarov, A.

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The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures by Ievtukh, V.A., Ulyanov, V.V., Nazarov, A.N.

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Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation by Houk, Y., Nazarov, A.N., Turchanikov, V.I., Lysenko, V.S., Andriaensen, S., Flandre, D.

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Atomic Structure in the Vicinity of Nanovoids and Features of These Defects by Germanov, A.B., Ershova, I.V., Kislitskaya, E.V., Nazarov, A.V., Zaluzhnyi, A.G.

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Hall ion source with ballistic and magnetic beam focusing by Bizyukov, A.A., Girka, A.I., Sereda, K.N., Nazarov, A.V., Romaschenko, E.V.

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Emission characteristics and potential of macroparticle in beam-plasma discharge by Bizyukov, A.A., Romaschenko, E.V., Sereda, K.N., Chibisov, A.D., Nazarov, A.V.

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Photoluminescent properties of oxidized stochiometric and carbon-rich amorphous Si₁₋xCx:H films by Vasin, A.V., Ishikawa, Y., Rusavsky, A.V., Nazarov, A.N., Konchitz, A.A., Lysenko, V.S.

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Modeling of grain subdivision during severe plastic deformation by VPSC method combined with disclination analysis by Nazarov, A.A., Enikeev, N.A., Romanov, A.E., Orlova, T.S., Alexandrov, I.V., Beyerlei, n I.J.

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Enhancement of CdSSe QD exciton luminescence efficiency by hydrogen RF plasma treatment by Kunets, V.P., Kulish, N.R., Strelchuk, V.V., Nazarov, A.N., Tkachenko, A.S., Lysenko, V.S., Lisitsa, M.P.

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High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs by Lysenko, V.S., Rudenko, T.E., Nazarov, A.N., Kilchitskaya, V.I., Rudenko, A.N., Limanov, A.B., Colinge, J.-P.

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Effect of chemical and radiofrequency plasma treatment on photoluminescence of SiOx films by Indutnyy, I.Z., Lysenko, V.S., Min'ko, V.I., Nazarov, A.N., Tkachenko, A.S., Shepeliavyi, P.E., Dan'ko, V.A., Maidanchuk, I.Yu.

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Direct synthesized graphene-like film on SiO₂: Mechanical and optical properties by Bortchagovsky, E.G., Vasin, A.V., Lytvyn, P.M., Tiagulskyi, S.I., Slobodian, A.M., Verovsky, I.N., Strelchuk, V.V., Stubrov, Yu., Nazarov, A.N.

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Erratum: Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions by Nazarov, A.N., Osiyuk, I.N., Tiagulskyi, S.I., Lysenko, V.S., Tyagulskyy, I.P., Torbin, V.N., Omelchuk, V.V., Nazarova, T.M., Rebohle, L., Skorupa, W.

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Electrical and light-emitting properties of silicon dioxide co-implanted by carbon and silicon ions by Nazarov, A.N., Osiyuk, I.N., Tiagulskyi, S.I., Lysenko, V.S., Tyagulskyy, I.P., Torbin, V.N., Omelchuk, V.V., Nazarova, T.N., Rebohle, L., Skorupa, W.

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Modification of electroluminescence and charge trapping in germanium implanted metal-oxide-silicon light-emitting diodes with plasma treatment by Nazarov, A.N., Skorupa, W., Vovk, Ja.N., Osiyuk, I.N., Tkachenko, A.S., Tyagulskii, I.P., Lysenko, V.S., Gebel, T., Rebohle, L., Yankov, R.A., Nazarova, T.M.

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Features of mechanical scanning probe lithography on graphene oxide and As(Ge)Se chalcogenide resist by Lytvyn, P.M., Malyuta, S.V., Indutnyi, I.Z., Efremov, A.A., Slobodyan, O.V., Min’ko, V.I., Nazarov, A.N., Borysov, O.V., Prokopenko, I.V.

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Reduced graphene oxide obtained using the spray pyrolysis technique for gas sensing by Slobodian, O.M., Milovanov, Yu.S., Skryshevsky, V.A., Vasin, A.V., Tang, X., Raskin, J.-P., Lytvyn, P.M., Svezhentsova, K.V., Malyuta, S.V., Nazarov, A.N.

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Graphene layers fabricated from the Ni/a-SiC bilayer precursor by Nazarov, A.N., Vasin, A.V., Gordienko, S.O., Lytvyn, P.M., Strelchuk, V.V., Nikolenko, A.S., Stubrov, Yu.Yu., Hirov, A.S., Rusavsky, A.V., Popov, V.P., Lysenko, V.S.

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Electroluminescent properties of Tb-doped carbon-enriched silicon oxide by Tiagulskyi, S.I., Nazarov, A.N., Gordienk, S.O., Vasin, A.V., Rusavsky, A.V., Nazarova, T.M., Gomeniuk, Yu.V., Rudko, G.V., Lysenko, V.S., Rebohle, L., Voelskow, M., Skorupa, W., Koshka, Y.

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