Харвестер відкритої науки НАН України

Comprehensive investigation of defects in highly perfect silicon single crystals

von Prokopenko, I.V., Kislovskii, E.N., Olikhovskii, S.I., Tkach, V.M., Lytvyn, P.M., Vladimirova, T.P.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

von Vladimirova, T.P., Kyslovs’kyy, Ye.M., Molodkin, V.B., Olikhovskii, S.I., Koplak, O.V., Kochelab, E.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

von Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

von Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
Veröffentlicht in Металлофизика и новейшие технологии (2016)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

von Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.
Veröffentlicht in Металлофизика и новейшие технологии (2015)