Comprehensive investigation of defects in highly perfect silicon single crystals за авторством Prokopenko, I.V., Kislovskii, E.N., Olikhovskii, S.I., Tkach, V.M., Lytvyn, P.M., Vladimirova, T.P.

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Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field за авторством Vladimirova, T.P., Kyslovs’kyy, Ye.M., Molodkin, V.B., Olikhovskii, S.I., Koplak, O.V., Kochelab, E.V.

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Double- and triple-crystal X-ray diffractometry of microdefects in silicon за авторством Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.

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Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals за авторством Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.

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New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects за авторством Molodkin, V.B., Storizhko, V.Yu., Kladko, V.P., Lizunov, V.V., Nizkova, A.I., Gudymenko, O.Yo., Olikhovskii, S.I., Tolmachev, M.G., Dmitriev, S.V., Demchyk, I.I., Bogdanov, E.I., Hinko, B.I.

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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St... за авторством Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.

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