Харвестер відкритої науки НАН України

Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution

von I. Fodchuk, S. Balovsyak, M. Borcha, Ya. Garabazhiv, V. Tkach
Veröffentlicht 2010

Determination of surface parameters of solids by methods of X-ray total external reflection

von Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution

von Fodchuk, I., Balovsyak, S., Borcha, M., Garabazhiv, Ya., Tkach, V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

von I. M. Fodchuk, I. I. Gutsuliak, R. A. Zaplitniy, S. V. Balovsyak, I. P. Yaremiy, Yu. Bonchyk, G. V. Savitskiy, I. M. Syvorotka, P. M. Lytvyn
Veröffentlicht 2013

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data

von M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko
Veröffentlicht 2019

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

von Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)