Харвестер відкритої науки НАН України

Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution

за авторством I. Fodchuk, S. Balovsyak, M. Borcha, Ya. Garabazhiv, V. Tkach
Опубліковано 2010

Determination of surface parameters of solids by methods of X-ray total external reflection

за авторством Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution

за авторством Fodchuk, I., Balovsyak, S., Borcha, M., Garabazhiv, Ya., Tkach, V.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

за авторством I. M. Fodchuk, I. I. Gutsuliak, R. A. Zaplitniy, S. V. Balovsyak, I. P. Yaremiy, Yu. Bonchyk, G. V. Savitskiy, I. M. Syvorotka, P. M. Lytvyn
Опубліковано 2013

Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data

за авторством M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko
Опубліковано 2019

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

за авторством Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.
Опубліковано в: Semiconductor Physics Quantum Electronics & Optoelectronics (2013)