Determination of surface parameters of solids by methods of X-ray total external reflection von Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.

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Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution von Fodchuk, I., Balovsyak, S., Borcha, M., Garabazhiv, Ya., Tkach, V.

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Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution von I. Fodchuk, S. Balovsyak, M. Borcha, Ya. Garabazhiv, V. Tkach

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Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions von I. M. Fodchuk, I. I. Gutsuliak, R. A. Zaplitniy, S. V. Balovsyak, I. P. Yaremiy, Yu. Bonchyk, G. V. Savitskiy, I. M. Syvorotka, P. M. Lytvyn

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data von M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, Yo. Gudymenko, O. I. Liubchenko

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data von Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

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