Search Results - Sachenko, A. V.
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Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features by Dmitruk, N.L., Karimov, A.V., Konakova, R.V., Kudryk, Ya.Ya., Sachenko, A.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2005)Get full text
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Optoelectronics and optoelectronic devices
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Hetero- and low-dimensional structures
silicon solar cells
surface photovoltage
surface recombination
кремнiєвi сонячнi елементи
Optics
Photoconduction and photovoltaic effects
Polymers and organic compounds
Semiconductor Physics
Semiconductor physics
Surface physics
Urbach effect
deep recombination level
diffusion length
emitter
heat treatments
influence of surface centers
near-surface layer
perovskite film
photosensitive silicon structure
recombination current
recombination losses
silicon
silicon dioxide layer
space charge region
transmission spectra
Полімери і органічні сполуки
Фотопровідність і фотовольтаїчні ефекти