Харвестер відкритої науки НАН України

Nucleation, growth and transformation of microdefects in FZ-Si

von Talanin, V.I., Talanin, I.E.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2004)

Recombination parameters of point defects in dislocation-free silicon single crystals

von Talanin, V.I., Talanin, I.E.
Veröffentlicht in Functional Materials (2006)

Classification of microdefects in semiconducting silicon

von Talanin, V.I., Talanin, I.E.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Modelling vacancy microvoid formation in dislocation-free silicon single crystals

von Talanin, V.I., Talanin, I.E., Koryagin, S.A., Semikina, M.Yu.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2006)

The aggregation of point defetc in dislocation-free silicon single crystals

von Talanin, V.I., Talanin, I.E., Voronin, A.A., Sirota, A.V.
Veröffentlicht in Functional Materials (2007)