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Peculiarities of injection phenomena in heavily doped silicon structures and development of radiation-resistant diode temperature sensors

To explain the experimental behaviour of differential characteristics (ideality factor, differential resistance) before and after radiation influence, a theoretical model of injection current flow mechanisms for the silicon diode temperature sensors (DTSs) is proposed. The observed nonmonotonic depe...

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Bibliographic Details
Main Authors: Shwarts, Yu.M., Sokolov, V.N., Shwarts, M.M., Venger, E.F.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2003
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/118002
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