Influence of elastic deformation on the residual ellipticity of polished optical materials
The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformati...
Збережено в:
| Дата: | 2003 |
|---|---|
| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
|
| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118078 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Influence of elastic deformation on the residual ellipticity of polished optical materials / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 514-516. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118078 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1180782017-05-29T03:05:21Z Influence of elastic deformation on the residual ellipticity of polished optical materials Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the application of elastic deformations leads to essential changes of the minimum ellipticity tgp of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature. 2003 Article Influence of elastic deformation on the residual ellipticity of polished optical materials / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 514-516. — Бібліогр.: 7 назв. — англ. 1560-8034 PACS: 42.86.+b, 78.20.-e http://dspace.nbuv.gov.ua/handle/123456789/118078 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the application of elastic deformations leads to essential changes of the minimum ellipticity tgp of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature. |
| format |
Article |
| author |
Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. |
| spellingShingle |
Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. Influence of elastic deformation on the residual ellipticity of polished optical materials Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Maslov, V.P. Sarsembaeva, A.Z. Sizov, F.F. |
| author_sort |
Maslov, V.P. |
| title |
Influence of elastic deformation on the residual ellipticity of polished optical materials |
| title_short |
Influence of elastic deformation on the residual ellipticity of polished optical materials |
| title_full |
Influence of elastic deformation on the residual ellipticity of polished optical materials |
| title_fullStr |
Influence of elastic deformation on the residual ellipticity of polished optical materials |
| title_full_unstemmed |
Influence of elastic deformation on the residual ellipticity of polished optical materials |
| title_sort |
influence of elastic deformation on the residual ellipticity of polished optical materials |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2003 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118078 |
| citation_txt |
Influence of elastic deformation on the residual ellipticity of polished optical materials / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 514-516. — Бібліогр.: 7 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT maslovvp influenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials AT sarsembaevaaz influenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials AT sizovff influenceofelasticdeformationontheresidualellipticityofpolishedopticalmaterials |
| first_indexed |
2023-10-18T20:31:17Z |
| last_indexed |
2023-10-18T20:31:17Z |
| _version_ |
1796150417720082432 |