Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

• Видавець: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
• Дата: 2004
• Автори: Maslov, V.P., Sarsembaeva, A.Z., Sizov, F.F.
• Формат: Стаття
• Мова: English
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
• Назва видання: Semiconductor Physics Quantum Electronics & Optoelectronics
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/118181
• Цитувати: Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 224-226. — Бібліогр.: 8 назв. — англ.

The elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the appli- cation of elastic deformations leads to essential changes of the minimum ellipticity tgρ of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature.