Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered t...
Збережено в:
| Дата: | 2012 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2012
|
| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/118718 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118718 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1187182017-06-01T03:05:32Z Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered thin gold layers. Ellipsometric spectra were compared with account of pictures of the films obtained by scanned electron microscopy. Remarkable dependence of depolarization of the reflected light with the frequency of localized plasmon resonance versus the film morphology was found. 2012 Article Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m http://dspace.nbuv.gov.ua/handle/123456789/118718 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
We have investigated optical properties of films of gold nanoparticles on
Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
morphology of the films. Different morphology of the films was obtained by flashannealing
at various temperatures of identical sputtered thin gold layers. Ellipsometric
spectra were compared with account of pictures of the films obtained by scanned electron
microscopy. Remarkable dependence of depolarization of the reflected light with the
frequency of localized plasmon resonance versus the film morphology was found. |
| format |
Article |
| author |
Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| spellingShingle |
Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| author_sort |
Bortchagovsky, E.G. |
| title |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_short |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_fullStr |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full_unstemmed |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_sort |
spectral-ellipsometric examining the films of gold nanoparticles on si/sio₂ substrate |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2012 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118718 |
| citation_txt |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT bortchagovskyeg spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT lozovskivz spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT mishakovato spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT hingerlk spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate |
| first_indexed |
2023-10-18T20:32:15Z |
| last_indexed |
2023-10-18T20:32:15Z |
| _version_ |
1796150463969624064 |