Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

• Дата: 2006
• Автори: Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2006
• Назва видання: Functional Materials
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/139962
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation / Ya.A. Shybiko, I.A. Shaykevich, L.Yu. Melnichenko // Functional Materials. — 2006. — Т. 13, № 1. — С. 161-163. — Бібліогр.: 6 назв. — англ.

The 80 Å and 100 Å thick Cr films and 45 Å thick Ti ones were obtained bу the vacuum evaporation on glass substrates. The ellipsometric parameter ψ (azimuth of the restored linear polarization ψ) was measured at λ = 546.1 nm both at the air side and the glass one under various angles of incidence. I...