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Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation
The 80 Å and 100 Å thick Cr films and 45 Å thick Ti ones were obtained bу the vacuum evaporation on glass substrates. The ellipsometric parameter ψ (azimuth of the restored linear polarization ψ) was measured at λ = 546.1 nm both at the air side and the glass one under various angles of incidence. I...
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| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2006
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| Series: | Functional Materials |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/139962 |
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