Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures

We consider ohmic contacts to the n-InSb epitaxial layers grown on a semi-insulating GaAs substrate. The ohmic contacts are formed through titanium metallization with subsequent gilding. Using the structural (AFM and XRD) and analytical (AES) techniques, we showed that thermal annealings at Т = 300...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2006
Hauptverfasser: Boltovets, N.S., Konakova, R.V., Kudryk, Ya.Ya., Milenin, V.V., Mitin, V.F., Mitin, E.V., Lytvyn, O.S., Kapitanchuk, L.M.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121434
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures / N.S. Boltovets, R.V. Konakova, Ya.Ya. Kudryk, V.V. Milenin, V.F. Mitin, E.V. Mitin, O.S. Lytvyn, L.M. Kapitanchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 58-60. — Бібліогр.: 2 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121434
record_format dspace
spelling Boltovets, N.S.
Konakova, R.V.
Kudryk, Ya.Ya.
Milenin, V.V.
Mitin, V.F.
Mitin, E.V.
Lytvyn, O.S.
Kapitanchuk, L.M.
2017-06-14T10:52:32Z
2017-06-14T10:52:32Z
2006
Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures / N.S. Boltovets, R.V. Konakova, Ya.Ya. Kudryk, V.V. Milenin, V.F. Mitin, E.V. Mitin, O.S. Lytvyn, L.M. Kapitanchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 58-60. — Бібліогр.: 2 назв. — англ.
1560-8034
PACS 81.05.Rm
https://nasplib.isofts.kiev.ua/handle/123456789/121434
We consider ohmic contacts to the n-InSb epitaxial layers grown on a semi-insulating GaAs substrate. The ohmic contacts are formed through titanium metallization with subsequent gilding. Using the structural (AFM and XRD) and analytical (AES) techniques, we showed that thermal annealings at Т = 300 °С (for 60 s) and 360 °С (for 30 s) do not change the phase composition of the metallization. This ensures thermal stability of the contacts and Hall sensors made on the basis of Au–Ti–n-InSb–GaAs(i) structures.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
spellingShingle Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
Boltovets, N.S.
Konakova, R.V.
Kudryk, Ya.Ya.
Milenin, V.V.
Mitin, V.F.
Mitin, E.V.
Lytvyn, O.S.
Kapitanchuk, L.M.
title_short Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
title_full Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
title_fullStr Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
title_full_unstemmed Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures
title_sort ohmic contacts to hall sensors based on n-insb-gaas(i) heterostructures
author Boltovets, N.S.
Konakova, R.V.
Kudryk, Ya.Ya.
Milenin, V.V.
Mitin, V.F.
Mitin, E.V.
Lytvyn, O.S.
Kapitanchuk, L.M.
author_facet Boltovets, N.S.
Konakova, R.V.
Kudryk, Ya.Ya.
Milenin, V.V.
Mitin, V.F.
Mitin, E.V.
Lytvyn, O.S.
Kapitanchuk, L.M.
publishDate 2006
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description We consider ohmic contacts to the n-InSb epitaxial layers grown on a semi-insulating GaAs substrate. The ohmic contacts are formed through titanium metallization with subsequent gilding. Using the structural (AFM and XRD) and analytical (AES) techniques, we showed that thermal annealings at Т = 300 °С (for 60 s) and 360 °С (for 30 s) do not change the phase composition of the metallization. This ensures thermal stability of the contacts and Hall sensors made on the basis of Au–Ti–n-InSb–GaAs(i) structures.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121434
citation_txt Ohmic contacts to Hall sensors based on n-InSb-GaAs(i) heterostructures / N.S. Boltovets, R.V. Konakova, Ya.Ya. Kudryk, V.V. Milenin, V.F. Mitin, E.V. Mitin, O.S. Lytvyn, L.M. Kapitanchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 58-60. — Бібліогр.: 2 назв. — англ.
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first_indexed 2025-12-02T05:37:36Z
last_indexed 2025-12-02T05:37:36Z
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