Luminescent analysis of the quality of CdS nanocrystals depending on technological parameters von Bogoslovskaya, A.B., Grynko, D.O., Bortchagovsky, E.G., Gudymenko, O.I.

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Anisotropy of elastic deformations in multilayer (In,Ga)As/GaAs structures with quantum wires: X-ray diffractometry study von Strelchuk, V.V., Kladko, V.P., Yefanov, O.M., Kolomys, O.F., Gudymenko, O.I., Valakh, M.Ya.

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