Modeling of X-ray rocking curves for layers after two-stage ion-implantation за авторством Liubchenko, O.I., Kladko, V.P., Gudymenko, O.Yo.

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Structure and electrical resistance of the passivating ZnSe layer on Ge за авторством Maslov, V.P., Fedorenko, A.V., Kladko, V.P., Gudymenko, O.Yo., Bozhko, K.M., Zashchepkina, N.M.

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Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry за авторством Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.

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Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film за авторством Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.

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Formation of silicon nanoclusters in buried ultra-thin oxide layers за авторством Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.

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Influence of small miscuts on self-ordered growth of Ge nanoislands за авторством Gudymenko, O.Yo., Kladko, V.P., Yefanov, O.M., Slobodian, M.V., Polischuk, Yu.S., Krasilnik, Z.F., Lobanov, D.V., Novikov, А.А.

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Influence of microwave radiation on relaxation processes in silicon carbide за авторством Bacherikov, Yu.Yu., Goroneskul, V.Yu., Gudymenko, O.Yo., Kladko, V.P., Kolomys, O.F., Krishchenko, I.M., Okhrimenko, O.B., Strelchuk, V.V.

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient за авторством Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.

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Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data за авторством Borcha, M.D., Solodkyi, M.S., Balovsyak, S.V., Tkach, V.M., Hutsuliak, I.I., Kuzmin, A.R., Tkach, O.O., Kladko, V.P., Gudymenko, O.Yo., Liubchenko, О.І., Swiatek, Z.

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Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics за авторством Vashchenko, V.A., Yatsenko, I.V., Kovalenko, Yu.I., Kladko, V.P., Gudymenko, O.Yo., Lytvyn, P.M., Korchovyi, A.A., Mamykin, S.V., Kondratenko, O.S., Maslov, V.P., Dorozinska, H.V., Dorozinsky, G.V.

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New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects за авторством Molodkin, V.B., Storizhko, V.Yu., Kladko, V.P., Lizunov, V.V., Nizkova, A.I., Gudymenko, O.Yo., Olikhovskii, S.I., Tolmachev, M.G., Dmitriev, S.V., Demchyk, I.I., Bogdanov, E.I., Hinko, B.I.

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