Investigation of cadmium telluride films on silicon substrate
Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than tha...
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| Дата: | 2005 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2005
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121545 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-121545 |
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irk-123456789-1215452017-06-15T03:02:46Z Investigation of cadmium telluride films on silicon substrate Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than that of monocrystalline CdTe and depends on the film thickness, increasing with the thickness growth. 2005 Article Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. 1560-8034 PACS 68.35.-p, 73.20.-r http://dspace.nbuv.gov.ua/handle/123456789/121545 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than that of monocrystalline CdTe and depends on the film thickness, increasing with the thickness growth. |
| format |
Article |
| author |
Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. |
| spellingShingle |
Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. Investigation of cadmium telluride films on silicon substrate Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. |
| author_sort |
Odarych, V.A. |
| title |
Investigation of cadmium telluride films on silicon substrate |
| title_short |
Investigation of cadmium telluride films on silicon substrate |
| title_full |
Investigation of cadmium telluride films on silicon substrate |
| title_fullStr |
Investigation of cadmium telluride films on silicon substrate |
| title_full_unstemmed |
Investigation of cadmium telluride films on silicon substrate |
| title_sort |
investigation of cadmium telluride films on silicon substrate |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2005 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/121545 |
| citation_txt |
Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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2023-10-18T20:39:32Z |
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