Peculiarities of neutron irradiation influence on GaP light-emitting structures

GaP LEDs irradiated by reactor neutrons were studied by optical and electrical methods. The observed emission intensity degradation is related with two factors: 1) radiation fields that destroy bond excitons and 2) decrease in the free charge carrier concentration, which is caused by their captur...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2009
Автори: Litovchenko, P., Litovchenko, A., Konoreva, O., Opilat, V., Pinkovska, M., Tartachnyk, V.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118874
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Peculiarities of neutron irradiation influence on GaP light-emitting structures / P. Litovchenko, A. Litovchenko, O. Konoreva, V. Opilat, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С. 276-279. — Бібліогр.: 8 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118874
record_format dspace
spelling Litovchenko, P.
Litovchenko, A.
Konoreva, O.
Opilat, V.
Pinkovska, M.
Tartachnyk, V.
2017-05-31T19:47:50Z
2017-05-31T19:47:50Z
2009
Peculiarities of neutron irradiation influence on GaP light-emitting structures / P. Litovchenko, A. Litovchenko, O. Konoreva, V. Opilat, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С. 276-279. — Бібліогр.: 8 назв. — англ.
1560-8034
PACS 29.40.-n, 85.30.-z, 85.60.Dw
https://nasplib.isofts.kiev.ua/handle/123456789/118874
GaP LEDs irradiated by reactor neutrons were studied by optical and electrical methods. The observed emission intensity degradation is related with two factors: 1) radiation fields that destroy bond excitons and 2) decrease in the free charge carrier concentration, which is caused by their capture by radiation defects. Study of currentvoltage characteristics at 77 K by highly precession methods has revealed the appearance of N-shaped negative differential region caused by carrier tunneling onto deep levels in quantum wells, which might exist in initial and irradiated p-n structures. In some cases, improvement of current-voltage characteristics after neutron irradiation is observed. An assumption is made about the radiation-stimulated origin of this effect.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Peculiarities of neutron irradiation influence on GaP light-emitting structures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Peculiarities of neutron irradiation influence on GaP light-emitting structures
spellingShingle Peculiarities of neutron irradiation influence on GaP light-emitting structures
Litovchenko, P.
Litovchenko, A.
Konoreva, O.
Opilat, V.
Pinkovska, M.
Tartachnyk, V.
title_short Peculiarities of neutron irradiation influence on GaP light-emitting structures
title_full Peculiarities of neutron irradiation influence on GaP light-emitting structures
title_fullStr Peculiarities of neutron irradiation influence on GaP light-emitting structures
title_full_unstemmed Peculiarities of neutron irradiation influence on GaP light-emitting structures
title_sort peculiarities of neutron irradiation influence on gap light-emitting structures
author Litovchenko, P.
Litovchenko, A.
Konoreva, O.
Opilat, V.
Pinkovska, M.
Tartachnyk, V.
author_facet Litovchenko, P.
Litovchenko, A.
Konoreva, O.
Opilat, V.
Pinkovska, M.
Tartachnyk, V.
publishDate 2009
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description GaP LEDs irradiated by reactor neutrons were studied by optical and electrical methods. The observed emission intensity degradation is related with two factors: 1) radiation fields that destroy bond excitons and 2) decrease in the free charge carrier concentration, which is caused by their capture by radiation defects. Study of currentvoltage characteristics at 77 K by highly precession methods has revealed the appearance of N-shaped negative differential region caused by carrier tunneling onto deep levels in quantum wells, which might exist in initial and irradiated p-n structures. In some cases, improvement of current-voltage characteristics after neutron irradiation is observed. An assumption is made about the radiation-stimulated origin of this effect.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118874
citation_txt Peculiarities of neutron irradiation influence on GaP light-emitting structures / P. Litovchenko, A. Litovchenko, O. Konoreva, V. Opilat, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С. 276-279. — Бібліогр.: 8 назв. — англ.
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