Харвестер відкритої науки НАН України

Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

von Vladimirova, T.P., Kyslovs’kyy, Ye.M., Molodkin, V.B., Olikhovskii, S.I., Koplak, O.V., Kochelab, E.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)

Complex diffractometrical investigation of structural and compositional irregularities in GaAs:Si/GaAs films heavily doped with silicon

von Datsenko, L.I., Klad’ko, V.P., Lytvyn, P.M., Domagala, J., Machulin, V.F., Prokopenko, I.V., Molodkin, V.B., Maksimenko, Z.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

von Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2003)

Double- and triple-crystal X-ray diffractometry of microdefects in silicon

von Molodkin, V.B., Olikhovskii, S.I., Kyslovskyy, Ye.M., Len, E.G., Reshetnyk, O.V., Vladimirova, T.P., V.V. Lizunov, V.V., Lizunova, S.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

von Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
Veröffentlicht in Металлофизика и новейшие технологии (2016)

Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of St...

von Molodkin, V.B., Olikhovskii, S.I., Skakunova, E.S., Len, E.G., Kislovskii, E.N., Reshetnyk, O.V., Vladimirova, T.P., Lizunov, V.V., Skapa, L.N., Lizunova, S.V., Fuzik, E.V., Tolmachev, N.G., Ostafiychuk, B.K., Pylypiv, V.M., Garpul’, O.Z.
Veröffentlicht in Металлофизика и новейшие технологии (2015)

Models of Deformation Dependences of Total Integrated Intensity of Dynamical Diffraction in Single Crystals for Various Diffraction Conditions

von Brovchuk, S.M., Molodkin, V.B., Nizkova, A.I., Rudnytska, I.I., Grankina, G.L., Lizunov, V.V., Lizunova, S.V., Sheludchenko, B.V., Skakunova, E.S., Dmitriev, S.V., Zabolotnyi, I.N., Katasonov, A.A., Zhuravlev, B.F., Lekhnyak, R.V., Skapa, L.N., Irha, N.P.
Veröffentlicht in Металлофизика и новейшие технологии (2014)