Харвестер відкритої науки НАН України

Прибор и методы измерения параметров и степени однородности пленочных структур

von Makara, V. A., Odarych, V. A., Kepich, T. Yu., Preobragenskaya, T. D., Rudenko, O. V.
Veröffentlicht 2009

Evidence for photochemical transformations in porous silicon

von Shevchenko, V.B., Makara, V.A., Vakulenko, O.V., Dacenko, O.I., Rudenko, O.V.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Relation between structure inhomogeneities and relaxation processes in excited silicon crystals

von Makara, V.A., Kolomiets, A.M., Kolchenko, Yu.L., Naumenko, S.M., Rudenko, O.V., Steblenko, L.P.
Veröffentlicht in Functional Materials (2004)

Comprehensive studies of defect production and strained states in silicon epitaxial layers and device structures based on them

von Boltovets, N.S., Voitsikhovskyi, D.I., Konakova, R.V., Milenin, V.V., Makara, V.A., Rudenko, O.V., Mel’nichenko, M.M.
Veröffentlicht in Semiconductor Physics Quantum Electronics & Optoelectronics (2001)