AES and XPS characterization of TiN layers formed and modified by ion implantation за авторством Melnik, V., Popov, V., Kruger, D., Oberemok, O.

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Ultrasound effect on radiation damages in boron implanted silicon за авторством Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.

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Growth of silicon self-assembled nanowires by using gold-enhanced CVD technology за авторством Klimovskaya, A.I., Kalashnyk, Yu.Yu., Voroshchenko, A.T., Oberemok, O.S., Pedchenko, Yu.M., Lytvyn, P.M.

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Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film за авторством Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.

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Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites за авторством Trunov, M.L., Lytvyn, P.M., Nagy, P.M., Oberemok, O.S., Durkot, M.O., Tarnaii, A.A., Prokopenko, I.V., Rubish, V.M.

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient за авторством Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.

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