AES and XPS characterization of TiN layers formed and modified by ion implantation von Melnik, V., Popov, V., Kruger, D., Oberemok, O.

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Ultrasound effect on radiation damages in boron implanted silicon von Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.

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Growth of silicon self-assembled nanowires by using gold-enhanced CVD technology von Klimovskaya, A.I., Kalashnyk, Yu.Yu., Voroshchenko, A.T., Oberemok, O.S., Pedchenko, Yu.M., Lytvyn, P.M.

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Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film von Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.

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Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites von Trunov, M.L., Lytvyn, P.M., Nagy, P.M., Oberemok, O.S., Durkot, M.O., Tarnaii, A.A., Prokopenko, I.V., Rubish, V.M.

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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient von Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.

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