Open Science Harvester of NAS of Ukraine

Borophosphosilicate glass component analysis using secondary neutral mass spectrometry

by Oberemok, O., Lytvyn, P.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2002)

AES and XPS characterization of TiN layers formed and modified by ion implantation

by Melnik, V., Popov, V., Kruger, D., Oberemok, O.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (1999)

Ultrasound effect on radiation damages in boron implanted silicon

by Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2000)

Механiзми модифiкацiї профiлiв розподiлу домiшок при мас-спектрометричному аналiзi багатошарових наноструктур...

by Efremov, A. A., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Romanyuk, B. M.
Published 2019

Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film

by Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.
Published in Functional Materials (2016)

Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites

by Trunov, M.L., Lytvyn, P.M., Nagy, P.M., Oberemok, O.S., Durkot, M.O., Tarnaii, A.A., Prokopenko, I.V., Rubish, V.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2013)

Formation of silicon nanoclusters in buried ultra-thin oxide layers

by Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)

Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза

by Gamov, D. V., Gudymenko, O. I., Kladko, V. P., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Polishchuk, Yu. O., Romaniuk, B. M., Chernenko, V. V., Nasekа, V. M.
Published 2018