Search Results - Melnik, V. P.
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Be-ion-implanted p-n InSb diode for infrared applications. Modeling, fabrication, and characterization by Korotyeyev, V.V., Kochelap, V.O., Sapon, S.V., Romaniuk, B.M., Melnik, V.P., Dubikovskyi, O.V., Sabov, T.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2018)Get full text
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The effect of ion implantation on structural damage in compositionally graded AlGaN layers by Liubchenko, O.I., Kladko, V.P., Stanchu, H.V., Sabov, T.M., Melnik, V.P., Kryvyi, S.B., Belyaev, A.Ye.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2019)Get full text
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Formation of silicon nanoclusters in buried ultra-thin oxide layers by Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2011)Get full text
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Electrical properties of semiconductor structures with Si nanoclusters in SiO₂ grown by high temperature annealing technology of SiOx layer, X<2 by Bunak, S.V., Buyanin, A.A., Ilchenko, V.V., Marin, V.V., Melnik, V.P., Khacevich, I.M., Tretyak, O.V., Shkavro, A.G.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2010)Get full text
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Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient by Sabov, T.M., Oberemok, O.S., Dubikovskyi, O.V., Melnik, V.P., Kladko, V.P., Romanyuk, B.M., Popov, V.G., Gudymenko, O.Yo., Safriuk, N.V.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2017)Get full text
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Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза by Gamov, D. V., Gudymenko, O. I., Kladko, V. P., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Polishchuk, Yu. O., Romaniuk, B. M., Chernenko, V. V., Nasekа, V. M.
Published 2018
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Phase transition in vanadium oxide films formed by multistep deposition by Kladko, V.P., Melnik, V.P., Liubchenko, О.I., Romanyuk, B.M., Gudymenko, О.Yo., Sabov, Т.M., Dubikovskyi, О.V., Maksimenko, Z.V., Kosulya, О.V., Kulbachynskyi, O.A., Lytvyn, P.M., Efremov, О.O.
Published in Semiconductor Physics Quantum Electronics & Optoelectronics (2021)Get full text
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defects
mass spectrometry
дефекти
мас-спектрометрiя
Optoelectronics and optoelectronic devices
Semiconductor physics
Sensors
X-ray diffraction
buried layers
depth profile
diffusion
gettering
ion implantation
iron
iонна iмплантацiя
iонне розпилення
lifetime
multilayer structure
nanoclusters
silicon
simulation
sputtering
ultrasound excitation
багатошаровi структури
гетерування
дифузiя
залiзо
кремнiй
моделювання