Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it

von Kolyadina, E.Yu., Matveeva, L.A., Neluba, P.L., Venger, E.F.
Veröffentlicht 2015

The features of structural-impurity ordering of interfaces in Ta₂O₅-p-Si heterostructures (exposed to microwave pretreatment and aging) induced by further microwave treatment

von Kolyadina, E.Yu., Konakova, R.V., Matveeva, L.A., Mitin, V.F., Shynkarenko, V.V., Atanassova, E.
Veröffentlicht 2008

Effect of microwave radiation on optical transmission spectra in SiO₂/SiC structures

von Bacherikov, Yu.Yu., Konakova, R.V., Kolyadina, E.Yu., Kocherov, A.N., Okhrimenko, O.B., Svetlichnyi, A.M.
Veröffentlicht 2002

Interface features of SiO₂/SiC heterostructures according to methods for producing the SiO₂ thin films

von Bacherikov, Yu.Yu., Boltovets, N.S., Konakova, R.V., Kolyadina, E.Yu., Ledn’ova, T.M., Okhrimenko, O.B.
Veröffentlicht 2012

Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system

von Konakova, R.V., Milenin, V.V., Voitsikhovskyi, D.I., Kamalov, A.B., Kolyadina, E.Yu., Lytvyn, P.M., Lytvyn, O.S., Matveeva, L.A., Prokopenko, I.V.
Veröffentlicht 2001