Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

von A. A. Efremov, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, B. M. Romanyuk
Veröffentlicht 2015

Formation of silicon nanoclusters in buried ultra-thin oxide layers

von O. S. Oberemok, V. G. Litovchenko, D. V. Gamov, V. G. Popov, V. P. Melnik, Yo. Gudymenko, V. A. Nikirin, I. M. Khatsevich
Veröffentlicht 2011

Investigation of the Phase Interfaces in Periodic Multilayer Mo/Si Structures, Using the Method of Mass-Spectrometry of Neutral Particles

von Ju. P. Pershin, V. A. Sevrjukova, E. N. Zubarev, A. S. Oberemok, V. P. Melnik, B. N. Romanjuk, V. G. Popov, P. M. Litvin
Veröffentlicht 2013

Oxygen ion-beam modification of vanadium oxide films for reaching a high value of the resistance temperature coefficient

von T. M. Sabov, O. S. Oberemok, O. V. Dubikovskyi, V. P. Melnik, V. P. Kladko, B. M. Romanyuk, V. G. Popov, Yo. Gudymenko, N. V. Safriuk
Veröffentlicht 2017

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

von A. V. Sachenko, V. P. Kostylev, V. G. Litovchenko, V. G. Popov, B. M. Romanyuk, V. V. Chernenko, V. M. Naseka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Veröffentlicht 2013

Research of recombination characteristics of Cz-Si implanted with iron ions

von D. V. Gamov, O. I. Gudymenko, V. P. Kladko, V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, Yu. O. Polishchuk, B. M. Romaniuk, V. V. Chernenko, V. M. Naseka
Veröffentlicht 2013